Introduction to Many-Facet Rasch Measurement
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This revised and updated Second Edition provides an introduction to the psychometric analysis and evaluation of rater-mediated assessments using many-facet Rasch measurement (MFRM). Essay rating data are used to illustrate the study of rater errors and biases and their implications for drawing reliable, valid, and fair inferences from assessment outcomes.
Introduction to Many-Facet Rasch Measurement
$74.05
Sale price
$74.05
Regular price
Unit price
$74.05 each
Book Details
- ISBN
- 9783631656150
- Binding
- Hardcover
- Authors
- Thomas Eckes
- Publisher
- Peter Lang Gmbh, Internationaler Verlag Der Wissenschaften
- Published Date
- September 16, 2015
- Language
- English
- Pages
- 241
- Physical Info
- 0.8 in H x 8.3 in L x 5.9 in W (0.93 lb)